Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Z Chen; M Weyland; P Ercius; J Ciston; C Zheng; MS Fuhrer; AJ D'Alfonso; LJ Allen; SD Findlay

Journal article

Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Z Chen, M Weyland, P Ercius, J Ciston, C Zheng, MS Fuhrer, AJ D'Alfonso, LJ Allen, SD Findlay

Ultramicroscopy | ELSEVIER | Published : 2016

DOI: 10.1016/j.ultramic.2016.06.009

Abstract

Four-dimensional scanning transmission electron microscopy (4D-STEM) is a technique where a full two-dimensional convergent beam electron diffraction (CBED) pattern is acquired at every STEM pixel scanned. Capturing the full diffraction pattern provides a rich dataset that potentially contains more information about the specimen than is contained in conventional imaging modes using conventional integrating detectors. Using 4D datasets in STEM from two specimens, monolayer MoS2 and bulk SrTiO3, we demonstrate multiple STEM imaging modes on a quantitative absolute intensity scale, including phase reconstruction of the transmission function via differential phase contrast imaging. Practical iss..

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University of Melbourne Researchers

Les J. Allen Author

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Grants

Awarded by U.S. Department of Energy

Funding Acknowledgements

The authors wish to thank Drs N.R. Lugg and P.R. Miller for helpful discussions. This research was supported under the Australian Research Council's Discovery Projects funding scheme (Projects DP110102228 and DP140102538) and its DECRA funding scheme (Project DE130100739). Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, Office of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. The Monash Centre for Electron Microscopy is acknowledged for providing facilities for sample preparation, initial microscopy and data analysis.